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Versatile:
- Thermal Diffusivity
- Specific Heat
- Thermal Conductivity
- Through
and In Plane
- Bondline Resistance
Flexible:
- Automatic Sample
Changer
- Variable Flash
Pulse Width
- Powerful Windows
Software
- Ambient and Elevated
Temperature Testing (up to 300°C)
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The
new LFA 447 NanoFlash™ light flash
system makes thermal properties testing fast, easy and affordable.
The NanoFlash™ is the result of NETZSCH and Holometrix Micromet's
passion for engineering excellence and unmatched flash diffusivity application
experience, resulting in an exceptionally powerful tool for measuring thermophysical
properties.
Conforming to ASTM E1461, the Xenon flash lamp based NanoFlash™ uses
optical coupling to heat and read the sample surfaces, eliminating potential
interface thermal resistance, and making accurate measurement of thin samples,
coatings on a substrate and materials in a thin film or sandwich possible.
The NanoFlash™ can test samples both through and in the sample plane
over a diffusivity range covering materials from neat and filled polymers
to diamond.
The NanoFlash™ is fully automated: powerful Windows based software
controls the test temperature, flash lamp firing, and data analysis. The
available automatic sample changer allows the instrument to measure multiple
samples in one test. Each data point normally takes less than five minutes
from the time the furnace reaches the test temperature. The instrument
independently sets the flash power level, pulse width and temperature for
each sample. |
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Principle
of Operation
User replaceable xenon flash lamps fire a pulse at the sample's lower
surface, while the infrared detector measures the temperature rise of
the sample's top surface. The sophisticated software then determines
the sample's thermal diffusivity.
Specific heat is measured by comparing the actual temperature rise of
the sample to the temperature rise of a reference sample of known specific
heat.
The instrument can measure thermal diffusivity (a) and specific heat
(cp) simultaneously. The software uses these values and the bulk density
(r) to calculate thermal conductivity (l) from the equation:
l=arcp
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TECHNICAL
SPECIFICATIONS
| Sample Size |
1" (25.4mm),
0.5" (12.7mm) diameter, or 8mm square,
up to 0.12" (3mm) thick* |
| Temperature Range
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LFA 447/0
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Ambient, or
as controlled by external fluid source |
LFA 447/1
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Ambient to 200C |
LFA 447/2
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Ambient to
300C |
| Thermal Diffusivity
Range |
0.001
to 10 cm2/sec |
| Repeatability |
Thermal
Diffusivity: |
+/- 3% |
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Specific
Heat: |
+/- 5% |
| Accuracy |
Thermal
Diffusivity: |
+/- 5% |
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Specific
Heat: |
+/- 7% |
| Illumination
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Two Xenon
Flash Lamps, User Replaceable |
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Wavelength:
Wide Spectrum |
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Pulse Energy:
0-5 J/CM2 |
| Sensor Type |
INSb IR Detector
with integral dewar |
| Utilities |
115 or 230V
— 50/60 Hz, 10A |
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Liquid Nitrogen
- approx. 1l
/8hrs
(Integral dewar detector only) |
| Dimensions (LxWxH)
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\24 x 22 x
17 in |
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NETZSCH
Instruments, Inc. also offers contract thermal testing services and a complete
family of thermal analysis and thermoset cure monitoring instrumentation. |
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